It was a wonderful discussion on coverage analysis , discussed in detail how to analyse the coverage loss. Explained very clearly how to understand the concept and find the root cause.
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About me
* Expert in SoC/ASIC DFT architecture, with a proven track record of leading over 18 projects from start to successful tape-out.
* Proficient in a wide range of DFT methodologies, including Scan, Compression, OCC, JTAG, Boundary Scan, LBIST, and MBIST.
* Skilled in using industry-standard EDA tools such as Synopsys (TestMAX, DFT Compiler, VCS, Formality), Mentor (Tessent, Questa), and Cadence (NCsim, Xcelium).
* Experienced in complex hierarchical DFT insertion, pattern generation/retargeting, and formal verification (LEC) for DFT and ECO flows.
* Recognized contributor to the field with 7 publications and 2 patents in DFT.