Dr. Deepali Jagga is a self-motivated, reliable, and adaptable researcher with a results-driven approach. Her research primarily focuses on magnetic and ferroelectric tunnel junctions using high-k dielectric materials for memory applications such as MRAM, FeRAM, and RRAM. In addition to her core research, Dr. Jagga specializes in the fabrication and characterization of memory devices. She has expertise in advanced characterization techniques, including atomic force microscopy (AFM), scanning electron microscopy (SEM), piezo force microscopy (PFM), and semiconductor device analysis. Dr. Jagga is passionate about advancing memory technologies and bridging the gap between fundamental research and practical applications.